070-4121-5539
Business Area
Test
6, 8 & 12" Wafers and Bumped Wafers
Particle Control (Class 1K)
PBGA, FBGA, LGA, QFN, QFP, Flip Chip and Others
Customized special Package module
Pick & Place (Horizontal) Handler
Bowl feeder (Turret) Handler
Vertical Handler (150mil, 300mil)
Test Vector Conversion
Design Simulation Conversion
Conversion of Development Boards for ATE Mass Production Testing
Test Program Development and Conversion
Maker : CHROMA
Tester : 3380D 3360P 3360D
Prober : OPUS3
SOC PMIC DIGITAL
Probe Card & Board, PCB Design and Supply
TEST RESULTS DATABASE &
SBL (STATISTIC BIN LIMIT) CONTROL
WEB REPORT SYSTEM
REAL-TIME ANALYSIS TOOL
070-4121-5539